FREMONT, Calif., May 29, 2012 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Larry Anderson has been appointed Vice President of Worldwide Sales. Mr. Anderson will direct Aehr Test's worldwide sales organizations.
Mr. Anderson has over 25 years of sales and sales management experience with technology companies including 10 years with FormFactor, a leader in the semiconductor test probe card market, where he headed the sales and service efforts in North America and Europe. Prior to joining Aehr Test, Mr. Anderson also held various sales leadership positions with the memory and logic test businesses of Advantest/Verigy, a leader in the semiconductor test business as well as Cymer, the leading laser light source company whose products are used for pattering advanced semiconductors. Mr. Anderson received a B.B.A. from Western Michigan University.
"We are pleased to have Larry join us. He brings strong experience in semiconductor test sales to Aehr Test," said Gayn Erickson, president and chief executive officer of Aehr Test Systems. "We are confident that his experience and industry relationships will help to further strengthen and expand our worldwide customer base. We believe that this is an excellent time to bring on board a person of Larry's caliber as we are seeing an upturn in activity for our FOX™ and ABTS™ families of sort test and burn-in products."
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic and memory integrated circuits and has an installed base of more than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, capacity needs and opportunities for Aehr Test products in package and wafer level test. Aehr Test has developed and introduced several innovative products, including the ABTS and FOX family of test and burn-in systems and the DiePak® carrier. The ABTS system is used in production and qualification testing of packaged parts for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of Aehr Test's technology, acceptance by customers of the systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
CONTACT: Aehr Test Systems Carl N. Buck Vice President of Marketing (510) 623-9400 x381 Financial Relations Board Marilynn Meek Analyst/Investor Contact (212) 827-3773