LGVN » Topics » If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

This excerpt taken from the LGVN 10-Q filed May 14, 2009.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our Dragonfly Test PlatformTM integrated family of products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

These excerpts taken from the LGVN 10-K filed Mar 18, 2009.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

11



  • our current and potential customers may not accept or embrace our Dragonfly Test PlatformTM integrated family of products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

If the semiconductor industry does
not adopt embedded test technology on a widespread basis, our revenues could
decline and our stock price could fall.


     To date,
the semiconductor industry has not adopted embedded test technology as an
alternative to current testing methods on a widespread basis. If the
semiconductor industry does not adopt embedded test technology widely and in the
near future, our growth will be limited, our revenues could decline, and our
stock price could fall. We cannot provide assurance that integrated circuit
designers and design companies’ customers will accept embedded test technology
as an alternative to current testing methods in the time frame we anticipate, or
at all. The industry may fail to adopt embedded test technology for many
reasons, including the following:


11







  • our current and potential customers may not accept
    or embrace our Dragonfly Test PlatformTM
    integrated family of
    products;
     

  • potential customers may determine that existing
    solutions adequately address their testing needs, or the industry may

    develop alternative technologies to address their
    testing needs;
     

  • potential customers may not be willing to accept
    the perceived delays in the early design stages associated with
    implementing embedded test technology in order to achieve
    potential time and cost savings at later stages of silicon
    debugging and production testing;
     

  • potential customers may have concerns over the
    reliability of embedded testing methods relative to existing test
    methods;
     

  • our existing and potential customers may react to
    declines in demand for semiconductors by curtailing or delaying new

    initiatives for new complex semiconductors or by
    extending the approval process for new projects, thereby lengthening

    our sales cycles; and
     

  • designers may be reluctant to take on the added
    responsibility of incorporating embedded test technology as part of
    their
    design process, or to learn how to
    implement embedded test technology.

If the semiconductor industry does
not adopt embedded test technology on a widespread basis, our revenues could
decline and our stock price could fall.


     To date,
the semiconductor industry has not adopted embedded test technology as an
alternative to current testing methods on a widespread basis. If the
semiconductor industry does not adopt embedded test technology widely and in the
near future, our growth will be limited, our revenues could decline, and our
stock price could fall. We cannot provide assurance that integrated circuit
designers and design companies’ customers will accept embedded test technology
as an alternative to current testing methods in the time frame we anticipate, or
at all. The industry may fail to adopt embedded test technology for many
reasons, including the following:


11







  • our current and potential customers may not accept
    or embrace our Dragonfly Test PlatformTM
    integrated family of
    products;
     

  • potential customers may determine that existing
    solutions adequately address their testing needs, or the industry may

    develop alternative technologies to address their
    testing needs;
     

  • potential customers may not be willing to accept
    the perceived delays in the early design stages associated with
    implementing embedded test technology in order to achieve
    potential time and cost savings at later stages of silicon
    debugging and production testing;
     

  • potential customers may have concerns over the
    reliability of embedded testing methods relative to existing test
    methods;
     

  • our existing and potential customers may react to
    declines in demand for semiconductors by curtailing or delaying new

    initiatives for new complex semiconductors or by
    extending the approval process for new projects, thereby lengthening

    our sales cycles; and
     

  • designers may be reluctant to take on the added
    responsibility of incorporating embedded test technology as part of
    their
    design process, or to learn how to
    implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Nov 7, 2008.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Jul 31, 2008.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed May 2, 2008.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

These excerpts taken from the LGVN 10-K filed Mar 21, 2008.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products;

  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

11



  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

If the semiconductor industry does
not adopt embedded test technology on a widespread basis, our revenues could
decline and our stock price could fall.


     To date,
the semiconductor industry has not adopted embedded test technology as an
alternative to current testing methods on a widespread basis. If the
semiconductor industry does not adopt embedded test technology widely and in the
near future, our growth will be limited, our revenues could decline, and our
stock price could fall. We cannot provide assurance that integrated circuit
designers and design companies’ customers will accept embedded test technology
as an alternative to current testing methods in the time frame we anticipate, or
at all. The industry may fail to adopt embedded test technology for many
reasons, including the following:




  • our current and potential customers
    may not accept or embrace our LV2005
    TM integrated family of products;



  • potential customers may determine
    that existing solutions adequately address their testing needs, or the
    industry may develop alternative
    technologies to address their testing needs;



  • potential
    customers may not be willing to accept the perceived delays in the early
    design stages associated with
    implementing embedded test technology in order to achieve potential
    time and cost savings at later stages of silicon

    debugging and production
    testing;


11







  • potential customers may have concerns over the
    reliability of embedded testing methods relative to existing test
    methods;
     

  • our existing and potential customers may react to
    declines in demand for semiconductors by curtailing or delaying new

    initiatives for new complex semiconductors or by
    extending the approval process for new projects, thereby lengthening

    our sales cycles; and
     

  • designers may be reluctant to take on the added
    responsibility of incorporating embedded test technology as part of
    their
    design process, or to learn how to
    implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Nov 2, 2007.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our YieldInsight (SiVisionTM) product, our Embedded SerDes Test product or our other recently announced products;
     
  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;
     
  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;
     
  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;
     
  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and
     
  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.
This excerpt taken from the LGVN 10-Q filed Jul 27, 2007.
If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

     To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

  • our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our YieldInsight (SiVisionTM) product, our Embedded SerDes Test product or our other recently announced products;

  • potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

  • potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

  • potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

  • our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

  • designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed May 4, 2007.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our SiVisionTM product, our Embedded SerDes Test product or our other recently announced products;

 

 

 

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-K filed Mar 13, 2007.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our SiVisionTM product, our Embedded SerDes Test product or our other recently announced products;

 

 

 

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Oct 27, 2006.

          If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

          •     Our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our SiVisionTM product or our Embedded SerDes Test product;

          •     Potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

          •     Potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

          •     Potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

          •     Our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

          •     Designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed May 15, 2006.

          If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

          •     Our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our SiVisionTM product or our Embedded SerDes Test product;

          •     Potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

          •     Potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

          •     Potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

          •     Our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

          •     Designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-K filed Mar 31, 2006.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

our current and potential customers may not accept or embrace our LV2005TM integrated family of products, our SiVisionTM product or our recently announced Embedded SerDes Test product;

 

 

 

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

10


 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Nov 9, 2005.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot provide assurance that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

our current and potential customers may not accept or embrace our new LV2005TM integrated family of products, our SiVisionTM product or our recently announced Embedded SerDes Test product;

 

 

 

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed Aug 12, 2005.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot assure you that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

our current and potential customers may not accept or embrace our new LV2005TM integrated family of products;

 

 

 

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles;

 

 

 

 

our current and potential customers may not accept or embrace our SiVisionTM product; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-Q filed May 16, 2005.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot assure you that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles;

 

 

 

 

our current and potential customers may not accept or embrace our LV2004TM integrated family of products;

 

 

 

 

our current and potential customers may not accept our SiVisionTM product; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

This excerpt taken from the LGVN 10-K filed Mar 18, 2005.

If the semiconductor industry does not adopt embedded test technology on a widespread basis, our revenues could decline and our stock price could fall.

          To date, the semiconductor industry has not adopted embedded test technology as an alternative to current testing methods on a widespread basis. If the semiconductor industry does not adopt embedded test technology widely and in the near future, our growth will be limited, our revenues could decline, and our stock price could fall. We cannot assure you that integrated circuit designers and design companies’ customers will accept embedded test technology as an alternative to current testing methods in the time frame we anticipate, or at all. The industry may fail to adopt embedded test technology for many reasons, including the following:

 

potential customers may determine that existing solutions adequately address their testing needs, or the industry may develop alternative technologies to address their testing needs;

 

 

 

 

potential customers may not be willing to accept the perceived delays in the early design stages associated with implementing embedded test technology in order to achieve potential time and cost savings at later stages of silicon debugging and production testing;

 

 

 

 

potential customers may have concerns over the reliability of embedded testing methods relative to existing test methods;

 

 

 

 

our existing and potential customers may react to declines in demand for semiconductors by curtailing or delaying new initiatives for new complex semiconductors or by extending the approval process for new projects, thereby lengthening our sales cycles;

 

 

 

 

our current and potential customers may not accept or embrace our recently released LV2004TM integrated family of products;

 

 

 

 

our current and potential customers may not accept the SiVision TM product; and

 

 

 

 

designers may be reluctant to take on the added responsibility of incorporating embedded test technology as part of their design process, or to learn how to implement embedded test technology.

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